UPS-XPS

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique used to analyse the elemental composition, chemical state, and electronic state of the elements present in a material's surface. It works by irradiating a sample with X-rays and measuring the kinetic energy and number of electrons that escape from the top 1-10 nm of the material being analysed.

XPS can detect all elements except hydrogen and helium, and provides information about the chemical bonding of atoms in the sample. It is widely used across many scientific and engineering fields for analyzing surfaces, thin films, and interfaces.

Uses & Capabilities

This equipment could be used for:

• Quality Control and Contaminant Analysis for instance to identify surface impurities and contaminants that can affect product quality. This includes analysing residues on electronic components, contaminants on polymer surfaces, and ensuring the proper passivation of stainless steel to prevent rusting
• Thin Film and Coating Analysis uch as electronics, pharmaceuticals, and materials science. Can be used to determine the composition, thickness, and uniformity of these films, which is essential for ensuring their performance and reliability
• Corrosion and Material Degradation Studies e.g to examine the surface chemistry of materials to understand and mitigate corrosion and degradation processes. Can be used in industries dealing with metals and alloys, where surface treatments and coatings are applied to enhance durability and performance.
• Catalyst surface characterization to examine the surface composition and chemical states of catalysts. This information is vital for optimizing catalytic processes and improving the efficiency and selectivity of catalytic reactions

Key Features

The Thermo Scientific ESCALAB Xi+ X-ray Photoelectron Spectrometer (XPS) is a state-of-the-art instrument designed for high-resolution surface analysis. It combines high spectral sensitivity and resolution with advanced quantitative imaging and multi-technique capabilities, making it highly versatile and configurable for various analytical needs.

The system is controlled by the powerful Thermo Scientific Avantage Data System, which integrates system control, data acquisition, processing, and reporting seamlessly.

High Sensitivity and Resolution

The ESCALAB Xi+ delivers high-quality spectra in seconds, thanks to its high spectral sensitivity and resolution capabilities

Advanced Imaging

It offers high-resolution quantitative imaging with a spatial resolution of less than 3 µm, enabling detailed surface analysis

Multi-technique Capability

The instrument supports various analytical techniques, including XPS, UPS, REELS, ISS etc. providing comprehensive surface characterization.

Flexible Sample Handling

The system features a five-axis manipulator for precise sample positioning, with capabilities for in-situ heating and cooling, and angle-resolved XPS analysis

Specifications

Monochromated X-ray source

Micro-focused Al K-Alpha source or optional micro-focused dual-anode Al K-Alpha and Ag L-Alpha source

Analyze

180°, double-focusing, bi-polar hemispherical analyzer with dual detector system for spectroscopy and imaging

Ion source

Monatomic EX06 ion source supplied as standard; option for MAGCIS dual mode ion source

Vacuum system

Two turbo molecular pumps for entry and analysis chambers, with rotary pumps or oil-free backing pumps; auto-firing, 3-filament titanium sublimation pump for analysis chamber

Sample stage

5-axis sample stage with sample heating and cooling capabilities

Analysis techniques

X-ray photoelectron spectroscopy (XPS), Reflected electron energy loss spectroscopy (REELS),  Ion scattering spectroscopy (ISS) UV lamp for UV photoelectron spectroscopy (UPS)