AFM AFM Oxford Instruments

Atomic Force Microscopy (AFM) is a powerful scanning probe microscopy technique that provides high-resolution imaging and measurement of surface properties at the nanoscale. It operates by using a sharp tip attached to a cantilever to scan across a sample surface, detecting minute forces between the tip and the sample to create detailed topographical maps. Beyond topography, AFM can measure various material properties such as mechanical, electrical, magnetic, and thermal characteristics, making it a versatile tool for applications in fields ranging from materials science to biology.

Uses & Capabilities

This equipment could be used for.

• Used for quality control of silicon integrated circuits, providing high-resolution topographical and electrical measurements essential for the development and manufacturing of semiconductor devices.
• Characterizing the mechanical properties, surface roughness, and morphology of various materials, including polymers, ceramics, and composites, which is vital for quality control of parts.
• Used in the development and analysis of nanomaterials, such as graphene and carbon nanotubes, by providing detailed imaging and mechanical measurements at the nanoscale.
• Used for failure analysis by identifying surface defects, analysing adhesive bonding, and detecting mechanical property variations at the nanoscale, which helps in improving product reliability and performance

Key capabilities

The Jupiter XR Atomic Force Microscope is a cutting-edge large-sample AFM designed for engineering applications. It offers both high-speed imaging and extended range capabilities in a single scanner, providing complete 200 mm sample access with higher resolution and faster results than other large-sample AFMs. The Jupiter XR features a modular design that adapts to various research needs, making it versatile for both academic and industrial R&D laboratories. With its extended-range 100 μm scanner, which is 5-20 times faster than most other AFMs, and its ability to perform a wide range of imaging modes including topography, mechanical properties, and electrical properties, the Jupiter XR is an ideal tool for engineers working on nanoscale and microscale.

Key Features

The Jupiter XR Atomic Force Microscope (AFM) by Asylum Research (Oxford Instruments) is a state-of-the-art large-sample AFM designed for high-resolution and fast imaging. Key features and specifications include:

• Large Sample Stage: It features a fully addressable 210 mm sample stage, providing complete 200 mm sample access, which is ideal for large-scale industrial applications.
• High-Speed Imaging: The extended range 100 μm scanner is 5-20 times faster than most other AFMs, enabling rapid data acquisition and high throughput.
• Versatility and Flexibility: The modular design allows for a wide range of imaging modes, including tapping mode, conductive AFM, and piezo response force microscopy, making it adaptable to various research and industrial needs.
• Ease of Use: The system is designed for simplicity and efficiency, from setup to results, ensuring a user-friendly experience even for complex measurements.

Specifications

• Sample Stage and Range: Fully addressable 210 mm sample stage, Complete 200 mm sample access, 100 μm x-y scan range, 12 μm z-range.
• Imaging Capabilities: High-speed and high-resolution imaging, Extended-range scanner for large-area scans, Compatible with most commercial cantilever probes up to 8 MHz resonance frequency.
• Versatility and Flexibility: Modular design with various accessories, Liquid stage for working with samples in liquid environments, Vacuum chuck for wafers up to 200 mm.
• Imaging Modes: Topography (Roughness, step-heights), Mechanical properties (Force-Distance Curves, Force Mapping, BiMODAL, AM-FM, Contact Resonance), Electrical properties (Conductive AFM, Electrostatic Force Microscopy, Kelvin Probe Force Microscopy, Piezo response Force Microscopy), Magnetic properties (Magnetic Force Microscopy).